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Digital IC Tester- GUT-6000B

Bench-Top Digital IC Tester.
The GUT-6000B is a desktop digital IC tester. Oriented toward automating testing tasks, the GUT-6000B contains high-end features such as auto-search and loop testing. Automated processes provide an intelligent and continuous process for detecting defective ICs. Self-diagnosis functions and over-load protection mechanisms make the GUT-6000A close to maintenance-free, releasing users from unnecessary hassles. The wide device coverage includes the 1800 series as well as the ubiquitous TTL and CMOS, providing a one-size fits-all solution for an IC testing bench area.

 

Features

  • Loop Test
  • Auto-Search
  • Seif-Diagnosis
  • Over-Load Protection
  • Measures 1800 Kinds of Device
  • 54/74 Series TTL
  • 4000 and 4500 Series CMOS
  • Test Socket: 28 Pin
TEST RANGE
  54/74 series TTL
CMOS 40/45
DRIVE
TEST VOLTAGE
  2.5/3.0/3.3/5V
TEST TIME
  Average Search Time: 0.6 Sec
DISPLAY
  16 Characters in 1 line LCD
POWER SOURCE
  AC 100V~240V+10%, 50/60Hz
DIMENSIONS & WEIGHT
  335(W) x 105(H) x 300(D) mm
Approx. 1.5kg
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Features Loop Test Auto-Search Seif-Diagnosis Over-Load Protection Measures 1800 Kinds of Device 54/74 Series TTL 4000 and 4500 Series CMOS Test Socket: 28 Pin ..
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